The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Nov. 03, 2016
Ictk Holdings Co., Ltd., Gyeonggi-do, KR;
Iucf-hyu (Industry-university Cooperation Foundation Hanyang University), Seoul, KR;
Byong Deok Choi, Seoul, KR;
Dong Kyue Kim, Seoul, KR;
ICTK Holdings Co., Ltd., Gyeonggi-do, KR;
IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY), Seoul, KR;
Abstract
Provided is a PUF by which an identification key is generated according to a random event caused by a semiconductor process variation. The PUF can provide the identification key as a result of electrical differences among elements. According to one embodiment, the PUF can accumulate the electrical differences and/or instantaneous values without generating the identification key by using the instantaneous values caused by the electrical differences. The accumulation may be the accumulation of a discrete iteration and the result thereof. However, according to another embodiment, the accumulation may be a continuation of the accumulation result during time intervals.