The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Nov. 27, 2020
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Junichi Iwai, Kobe, JP;

Joel . P Dunsmore, Sebastopol, CA (US);

Koji Murata, Kobe, JP;

Assignee:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2015.01); H04B 17/10 (2015.01);
U.S. Cl.
CPC ...
H04B 17/104 (2015.01);
Abstract

Residual noise of a frequency mixer is detected. A reference clock is used to generate a first radio frequency (RF) signal, a second RF signal and a third RF signal. The first RF signal and the second RF signal serve as input to the frequency mixer. The reference clock is used to generate a third RF signal. The reference clock is also used to control timing in a detector device. A second frequency mixer mixes an output of the DUT with the third RF signal to produce an input signal for a detector device. Mixing the output of the DUT with the third RF signal cancels at least some of the phase noise within the output signal of the DUT that results from phase noise in the first RF signal and from phase noise in the second RF signal. The detector device detects residual phase noise existing within the input signal for the detector device.


Find Patent Forward Citations

Iwai, Junichi. (2021). System and method for measuring residual phase noise of a frequency mixer (U.S. Patent No. 11095376). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11095376

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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