The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Jan. 28, 2019
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Roderick D. Bacon, San Francisco, CA (US);

Nagendra Bage Jayaraj, San Jose, CA (US);

Derek J. DiCarlo, San Jose, CA (US);

Chi Kin Ho, Milpitas, CA (US);

Xingqun Li, San Jose, CA (US);

Jahan C. Minoo, San Jose, CA (US);

Surya Musunuri, San Jose, CA (US);

Tony Chi Wang Ng, Santa Clara, CA (US);

Carlos Ribas, Los Altos, CA (US);

Ching Yu John Tam, Los Gatos, CA (US);

Evan J. Thompson, Sunnyvale, CA (US);

Daniel C. Wagman, Scotts Valley, CA (US);

Di Zhao, Santa Clara, CA (US);

Robert D. Zupke, San Jose, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H02H 9/04 (2006.01); G06F 13/40 (2006.01); H04L 12/40 (2006.01); H01R 13/66 (2006.01); H01R 13/713 (2006.01); H01R 24/60 (2011.01); H01R 107/00 (2006.01);
U.S. Cl.
CPC ...
H02H 9/04 (2013.01); G06F 13/4068 (2013.01); H01R 13/6683 (2013.01); H01R 13/713 (2013.01); H01R 24/60 (2013.01); H04L 12/40045 (2013.01); H01R 2107/00 (2013.01); Y02D 10/00 (2018.01);
Abstract

A voltage of a first pin that is one of several pins of an external connector of a system is measured, while the first pin is un-driven except for being pulled to ground through a first resistance, and a second pin of the external connector is being used as a power supply rail of the system. The measured voltage is compared to a short circuit threshold and in response to that threshold being exceeded, the power supply voltage on the second pin is reduced. In such an embodiment, no test stimulus needs to be applied to any of the pins of the external connector. Other embodiments are also described and claimed.


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