The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Jul. 10, 2017
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Hideki Yamamoto, Kyoto, JP;

Atsuhiko Toyama, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/00 (2006.01); H01J 49/40 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0031 (2013.01); H01J 49/40 (2013.01);
Abstract

A device that performs MSn analysis including: a mass window group setting information input receiver that receives input of information concerning the number of mass window groups, the number of mass windows, and a mass-to-charge ratio width of each of the mass windows; a mass window group setter that sets a first mass window group and a second mass window group, in which a mass-to-charge ratio at a boundary of adjacent mass windows differs from a mass-to-charge ratio at a boundary of mass windows in the first mass window group; a product-ion scan measurement section that performs, for each of the first and second mass window groups, an operation of performing scan measurement of product ions by use of the plurality of mass windows in sequence to acquire pieces of product-ion scan data; and a product-ion spectrum generator that generate a product-ion spectrum by integrating pieces of product-ion scan data.


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