The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Apr. 14, 2020
Applicant:

Samsung Display Co., Ltd., Yongin-si, KR;

Inventors:

Sung-Jun Kim, Hwaseong-si, KR;

Myung-Seok Kwon, Namyangju-si, KR;

Deok-Hwan Kim, Asan-si, KR;

Yun-Tae Kim, Seoul, KR;

Jeong-Hyun Kim, Seongnam-si, KR;

Hasook Kim, Hwaseong-si, KR;

Bongchun Park, Incheon, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09G 3/00 (2006.01); G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
G09G 3/006 (2013.01); G01R 31/2884 (2013.01); G01R 31/2896 (2013.01); G09G 2300/0426 (2013.01); G09G 2330/12 (2013.01);
Abstract

A display device includes a display panel including first to fourth panel pads and a connection board including first to fourth connection board pads coupled to the first to fourth pads, respectively. The first and second panel pads are electrically connected to each other, and the third and fourth panel pads are electrically connected to each other. The connection board includes a driving circuit which generates a first test result signal based on a first panel test signal transmitted to the first connection board pad and a first panel feedback signal received from the second connection board pad, generates a second test result signal based on a second panel test signal transmitted to the third connection board pad and a second panel feedback signal received from the fourth connection board pad, and sequentially outputs the first and second test result signals as a test result signal.


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