The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jul. 25, 2018
Obayashi Corporation, Tokyo, JP;
Yuichi Ikeda, Tokyo, JP;
Tamaki Horii, Tokyo, JP;
Kazuyuki Goto, Tokyo, JP;
Hidefumi Takenaka, Tokyo, JP;
Takayuki Yamamoto, Tokyo, JP;
OBAYASHI CORPORATION, Tokyo, JP;
Abstract
An inspection processing system includes a control unit connected to a photographing unit and an output unit. The control unit includes circuitry. The inspection processing system identifies a current position, displays a virtual image of a three-dimensional model of a structure corresponding to the current position. The virtual image is superimposed on a structure image obtained from the photographing unit. The inspection processing system further obtains an evaluation result of an evaluation item of an inspection subject using the structure image on which the displayed virtual image is superimposed, and records the evaluation result in an inspection information memory in association with the position of the inspection subject in the three-dimensional model.