The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Mar. 30, 2018
Peking University, Beijing, CN;
Peking University, Beijing, CN;
Abstract
A progressive photon mapping method based on statistical test includes launching rays from the viewpoint to each pixel on the image plane and intersecting the three-dimensional scene to be rendered. If an intersection with diffuse surface is found on the tracing path, it is recorded as the hit point; a photon pass is performed: 31) performing photon tracing step; 32) performing photon collection processing for each hit point; 33) if the current iteration of photon pass does not need chi-square test, then performing flux accumulation and keeping the collection radius unchanged; if chi-square is required, evaluating the photon distribution quality; computing a collection radius according to the estimated photon distribution, and performing the flux accumulation in the current photon pass; 34) if the photon collection radius is reduced, then performing distributed ray tracing, generating new hit points, and go to 31), otherwise go to 31), start a new iteration of photon pass.