The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Oct. 30, 2018
Applicant:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Inventors:
Andrii Volochniuk, Kyiv, UA;
Yong-Chan Keh, Seoul, KR;
Jung-Kee Lee, Osan-si, KR;
Sung-Soon Kim, Seoul, KR;
Sun-Kyung Kim, Busan, KR;
Andrii But, Kyiv, UA;
Andrii Sukhariev, Kyiv, UA;
Dmytro Vavdiyuk, Kyiv, UA;
Konstantin Morozov, Kyiv, UA;
Assignee:
Samsung Electronics Co., Ltd., Suwon-si, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G06K 9/20 (2006.01); H04N 5/33 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06T 7/521 (2017.01); G06K 9/2063 (2013.01); G06K 9/6202 (2013.01); G06K 2009/6213 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/10048 (2013.01); H04N 5/33 (2013.01);
Abstract
A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.