The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Dec. 07, 2018
Applicant:
Hitomi Kaneko, Saitama, JP;
Inventor:
Hitomi Kaneko, Saitama, JP;
Assignee:
RICOH COMPANY, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2017.01); G03G 15/00 (2006.01); G06K 9/03 (2006.01); G06K 15/02 (2006.01); H04N 1/00 (2006.01); B41F 33/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); B41F 33/0036 (2013.01); G03G 15/5062 (2013.01); G03G 15/5095 (2013.01); G03G 15/553 (2013.01); G06K 9/036 (2013.01); G06K 15/027 (2013.01); G06T 7/0002 (2013.01); H04N 1/00005 (2013.01); H04N 1/00015 (2013.01); H04N 1/00045 (2013.01); H04N 1/00047 (2013.01); H04N 1/00681 (2013.01); G06T 2207/30144 (2013.01);
Abstract
An inspection apparatus includes a reading device and a processor. The reading device is configured to read printed matter with an image that is printed on a printing medium based on a source image to generate a read image. The processor is configured to generate a reference image based on the source image, determine whether an inspection is to be executed based on a size of the source image and a size of the printing medium, and compare the reference image with the read image to inspect quality of the printed matter in response to a determination that the inspection is to be executed.