The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Feb. 03, 2015
Applicant:

Fair Isaac Corporation, San Jose, CA (US);

Inventors:

Scott M. Zoldi, San Diego, CA (US);

Stuart C. Wells, Sunnyvale, CA (US);

Assignee:

FAIR ISAAC CORPORATION, San Jose, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 30/06 (2012.01); G06K 9/00 (2006.01); G06Q 20/40 (2012.01);
U.S. Cl.
CPC ...
G06Q 30/0609 (2013.01); G06K 9/00899 (2013.01); G06Q 20/4016 (2013.01); G06Q 20/40145 (2013.01);
Abstract

A biometric measures profiling analytics system and method are presented. The system and method include collecting biometric data associated with a consumer, and determining one or more biometric variables representing a measurable aspect of the biometric data. The system and method further include generating, based on at least one of the one or more biometric variables, at least one biometric profile variable associated with the consumer, the at least one biometric profile variable representing a degree of normality or abnormality of the collected and calibrated biometric data as compared to a biometric history of the consumer. The system and method further include generating a behavioral score for the consumer based on the collected and calibrated biometric data and with at least one biometric profile variable, the behavioral score representing a degree of risk of normality or abnormality of an event associated with the biometric data.


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