The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Nov. 06, 2017
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Takayuki Katsuki, Tokyo, JP;

Michiharu Kudoh, Kanagawa-ken, JP;

Hiroaki Nakamura, Kanagawa-ken, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 7/00 (2006.01); G06N 5/02 (2006.01);
U.S. Cl.
CPC ...
G06N 7/005 (2013.01); G06N 5/022 (2013.01);
Abstract

A method including receiving designation of an input node for which a node value is generated from collected data, an option node to which a node value is arbitrarily provided, and an estimation target node to be a target of a node value estimation, in a graph including nodes and directional edges; and identifying a directional edge for which a conditional probability is to be acquired to measure the node value of the estimation target node, from among the directional edges, by traversing a directional edge that can propagate an effect to a node value from the estimation target node. The identifying includes, for the option node, traversing both a directional edge that can propagate an effect if a node value is provided to the option node and a directional edge that can propagate an effect if a node value is not provided to the option node.


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