The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
May. 22, 2015
Fair Isaac Corporation, San Jose, CA (US);
Fair Isaac Corporation, Roseville, MN (US);
Abstract
A method for detecting fraud and non-fraud pattern changes can be based on transaction pathway transversal analysis. A decision tree can be built based on a training dataset from a reference dataset. Pathway transversal information can be recorded along each pathway for the reference dataset. A first mean and a first variance of a class probability can be calculated of all samples over each pathway. A pathway distribution for a new transaction dataset under investigation and a second mean and a second variance of all samples of the new transaction dataset can be obtained. The second mean and the second variance can represent a fraud probability. The deviation metrics between one or more feature statistics of a feature along each pathway for the reference dataset and the new dataset can be determined on a local level. Feature contributors to pattern changes can be determined by analyzing the deviation metrics.