The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Feb. 05, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Satoshi Hara, Tokyo, JP;

Takayuki Katsuki, Tokyo, JP;

Tetsuro Morimura, Tokyo, JP;

Yasunori Yamada, Saitama, JP;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/08 (2006.01); G06N 3/04 (2006.01); G06N 7/00 (2006.01);
U.S. Cl.
CPC ...
G06N 3/08 (2013.01); G06N 3/0454 (2013.01); G06N 7/005 (2013.01);
Abstract

Optimized learning settings of neural networks are efficiently determined by an apparatus including a processor and one or more computer readable mediums collectively including instructions that, when executed by the processor, cause the processor to train a first neural network with a learning setting; extract tentative weight data from the first neural network with the learning setting; calculate an evaluation value of the first neural network with the learning setting; and generate a predictive model for predicting an evaluation value of a second neural network with a new setting based on tentative weight data of the second neural network by using a relationship between the tentative weight data of the first neural network and the evaluation value of the first neural network.


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