The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Dec. 27, 2017
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Min Zhang, San Ramon, CA (US);

Gopal Biligeri Avinash, San Ramon, CA (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 3/04 (2006.01); G06N 3/08 (2006.01); G16H 30/40 (2018.01); G06N 20/20 (2019.01); G06K 9/62 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06N 3/0454 (2013.01); G06K 9/6267 (2013.01); G06N 3/08 (2013.01); G06N 20/20 (2019.01); G06T 7/0012 (2013.01); G16H 30/40 (2018.01); G06K 2209/05 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract

Systems and techniques for facilitating image analysis using deviation from normal data are presented. In one example, a system generates atlas map data indicative of an atlas map that includes a first portion of patient image data from a plurality of reference patients and a second portion of the patient image data from a plurality of target patients. The first portion of the patient image data is matched to a corresponding age group for a set of patient identities associated with the first portion of the patient image data. The system also generates deviation map data that represents an amount of deviation for the second portion of the patient image data compared to the first portion of the patient image data. Furthermore, the system trains a neural network based on the deviation map data to determine one or more clinical conditions.


Find Patent Forward Citations

Zhang, Min. (2021). Image analysis using deviation from normal data (U.S. Patent No. 11093820). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11093820

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…