The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
May. 16, 2019
Omron Corporation, Kyoto, JP;
Tomonori Ariyoshi, Kusatsu, JP;
Toyoo Iida, Nagaokakyo, JP;
OMRON Corporation, Kyoto, JP;
Abstract
A configuration capable of realizing object authentication with higher accuracy is desired. A measurement system includes a shape measurement unit that performs measurement, a storage unit that stores an entire model for each work piece type, and a recognition processing unit that executes object authentication based on whether or not a three-dimensional shape measured by the shape measurement unit is consistent with any one entire model stored in the storage unit. The entire model for each work piece type is specified by a combination of a plurality of partial models and each of the plurality of partial models is correspondently given a degree of importance. The recognition processing unit determines whether or not the three-dimensional shape is consistent with any one entire model based on degrees of importance corresponding to one or more partial models included in the entire model.