The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
May. 08, 2019
Applicants:
Juntendo Educational Foundation, Tokyo, JP;
Sysmex Corporation, Kobe, JP;
Inventors:
Assignees:
JUNTENDO EDUCATIONAL FOUNDATION, Tokyo, JP;
SYSMEX CORPORATION, Hyogo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/62 (2006.01); G06N 3/08 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06K 9/00147 (2013.01); G06K 9/628 (2013.01); G06K 9/6257 (2013.01); G06N 3/08 (2013.01); G06T 7/0012 (2013.01); G06T 2207/20076 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
Disclosed is an image analysis method including inputting analysis data, including information regarding an analysis target cell to a deep learning algorithm having a neural network structure, and analyzing an image by calculating, by use of the deep learning algorithm, a probability that the analysis target cell belongs to each of morphology classifications of a plurality of cells belonging to a predetermined cell group.
Ohsaka, Akimichi. (2021). Image analysis method, apparatus, non-transitory computer readable medium, and deep learning algorithm generation method (U.S. Patent No. 11093729). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11093729
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