The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jul. 01, 2019
The Boeing Company, Chicago, IL (US);
Yunpeng Zhang, Brisbane, AU;
Dorival de Moraes Pedroso, Brisbane, AU;
Andrew Jon Eugene Stephan, Brisbane, AU;
Michael Charles Elford, Springfield, AU;
THE BOEING COMPANY, Chicago, IL (US);
Abstract
Yield criteria of a material are estimated by obtaining test data representing anisotropic material properties of the material and performing an iterative evolutionary search to identify parameters of a function descriptive of the yield criteria of the material. The evolutionary search includes determining an error value based on a first data point of a first population, where the first data point representing potential values of the parameters. The evolutionary search also includes performing an evolutionary process to generate a second data point as a candidate for replacing the first data point in a second population and determining a second error value based on the second data point. Either the first data point or the second data point is selected for inclusion in the second population. Output data is generated based on estimated values of the parameters that are identified by the evolutionary search.