The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jun. 27, 2013
Min He, Palo Alto, CA (US);
Frank Le, Palo Alto, CA (US);
Hiren Kotadia, Palo Alto, CA (US);
Hemant Puranik, Palo Alto, CA (US);
Abhiram Gujjewar, Palo Alto, CA (US);
David Kung, Palo Alto, CA (US);
Min He, Palo Alto, CA (US);
Frank Le, Palo Alto, CA (US);
Hiren Kotadia, Palo Alto, CA (US);
Hemant Puranik, Palo Alto, CA (US);
Abhiram Gujjewar, Palo Alto, CA (US);
David Kung, Palo Alto, CA (US);
SAP SE, Walldorf, DE;
Abstract
Systems and methods for just-in-time data quality assessment of best records created during data migration are disclosed. A data steward includes tools for creating and editing a best record creation strategy that defines how records from multiple systems will be integrated into target systems. At design time, the data steward can generate best record creation and validation rules based on the best record creation strategy. The data steward can apply the best record creation and validation rules to a sample of matched records from multiple data sources to generate a sample set of best records. The efficacy of the best record creation rules can be evaluated by assessing the number of fields in the sample set that fail the validation rules. During review, the validation rules can be applied to edits to the best records received from a human reviewer to ensure compliance with the best record creation strategy.