The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Jun. 27, 2019
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Zhao Cao, Beijing, CN;

Ju Wei Shi, Beijing, CN;

Chen Wang, Beijing, CN;

Lanjun Wang, Beijing, CN;

Shuo Zhang, Beijing, CN;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/20 (2006.01); G06F 16/21 (2019.01);
U.S. Cl.
CPC ...
G06F 16/211 (2019.01);
Abstract

Methods and a system are provided. A method includes automatically detecting, by an attribute structural variation detector, attribute structural variations in record schemas of a database lacking schema enforcement. The automatically detecting step includes encoding, by an encoder, nodes in the record schemas based on respective updated node labels to obtain a plurality of codes. The encoding step comprises, for each of the plurality of codes: recording, by a label frequency counter, a frequency fof the record schemas that include a given label; and recording, by a label frequency counter, a frequency fof the record schemas that use a given one of the plurality of codes to update a label of a next level. An attribute variation is detected and retrieved responsive to the frequency f≠0, and the frequency f>(two times the frequency f).


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