The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Feb. 25, 2020
Applicant:

Emc Ip Holding Company Llc, Hopkinton, MA (US);

Inventors:

Mahesh Reddy A V, Bangalore, IN;

Pradeep Viveki, Bangalore, IN;

Mahantesh Ambaljeri, Bangalore, IN;

Assignee:

EMC IP HOLDING COMPANY LLC, Hopkinton, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/14 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1451 (2013.01); G06F 3/067 (2013.01); G06F 3/0619 (2013.01); G06F 3/0653 (2013.01); G06F 11/1464 (2013.01); G06F 11/1469 (2013.01);
Abstract

Methods and systems for data auto-tiering are disclosed. According to some embodiments, the method receives a multiplicity of data streams. For each data stream, the method detects a data change within the data stream. The method further determines a magnitude of the data change. The method further assigns a tier level to the data stream based on the magnitude of the data change.


Find Patent Forward Citations

Reddy A V, Mahesh. (2021). Systems and methods of data auto-tiering using relativized discrepancy (U.S. Patent No. 11093341). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11093341

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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