The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Dec. 18, 2018
Emc Ip Holding Company Llc, Hopkinton, MA (US);
Jianbin Kang, Beijing, CN;
Jian Gao, Beijing, CN;
Jibing Dong, Beijing, CN;
Ruiyong Jia, Beijing, CN;
Xinlei Xu, Beijing, CN;
Xiongcheng Li, Beijing, CN;
EMC IP Holding Company LLC, Hopkinton, MA (US);
Abstract
Techniques detect incomplete write of data. The techniques involve obtaining metadata associated with a sector in a parity disk of a Redundancy Array of Independent Disks (RAID), wherein the metadata includes a sequence stamp and a partial write flag, the sequence stamp changing with a write operation on a stripe to which the sector belongs, and the partial write flag indicating whether the stripe is partially written. The techniques further involve determining whether incomplete write of data is present in the RAID based on the metadata, and the techniques further involve in response to determining the incomplete write of the data being present in the RAID, rebuilding at least one disk in the RAID. By adding a sequence stamp and a partial write flag in the metadata of the sector of the RAID, incomplete write of data can be detected more accurately, thereby improving the reliability of RAID.