The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Aug. 13, 2019
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Takaharu Hiroe, Tokyo, JP;
Kazunari Ide, Tokyo, JP;
Yoshikatsu Ikawa, Tokyo, JP;
Ryo Sase, Tokyo, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
An abnormality detection device includes a processor and a storage unit connected to the processor. The processor is configured to execute an error vector acquisition process of acquiring an error vector representing a difference between a measurement value vector having multiple measurement values measured at a determination time as elements and an average value vector having an average value of the measurement values accumulated in the storage unit as an element, a component acquisition process of acquiring a plurality of components into which the error vector is decomposed with respect to a direction of a singular vector, a comparing process of comparing a value obtained by squaring each of the components into which the error vector is decomposed with respect to the direction of the singular vector with corresponding variance in the direction of the singular vector individually with respect to the direction of the singular vector, and a determination process of performing an abnormality determination on the basis of plural compared results in the comparing process.