The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jun. 01, 2017
Cetin Cetinkaya, Potsdam, NY (US);
Cetin Cetinkaya, Potsdam, NY (US);
Other;
Abstract
An in-process real-time method, system and device is provided for monitoring the quality of an article made by additive manufacturing processes. The invention involves the transmission and reception of waves into a test artifact while it is being built. The properties of received waves depend on the parameters of the additive manufacturing process, the properties of materials involved, and their irregularities as well as geometric deviations, as its structural periodicity and defects leads to the dispersion of waves. Based on the features of the artifact, the test artifact is designed to capture deviations in all or a sub-set of process, material, and geometric parameters. A computing device in communications with operators, the control unit of the additive manufacturing machine and other computing facilities is used for creating and analyzing waveforms. The disclosed system may initiate real-time actions based on the properties of the obtained waveforms.