The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Nov. 26, 2019
Mentor Graphics Corporation, Wilsonville, OR (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Yu Huang, West Linn, OR (US);
Siemens Industry Software Inc., Plano, TX (US);
Abstract
A test pattern is shifted into scan chains in a circuit in a first direction. The scan cells on each of the scan chains are further coupled to corresponding scan cells on two other scan chains in the scan chains such that data bits stored in the scan cells can be shifted circularly in a second direction orthogonal to the first direction based on a control signal. The loaded test pattern is then shifted in the second direction for a number of clock cycles equal to the number of the scan chains. The test pattern is then shifted in the first direction out of the scan chains to generate a chain test result. Faulty scan cell candidates on faulty scan chains may be determined based on part of the chain test result for one of good scan chains.