The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jun. 05, 2019
Acs Solutions Gmbh, Saarbruecken, DE;
Andrey Samokrutov, Moskau, RU;
Roman Pinchuk, Sulzbach, DE;
Andrey Bulavinov, Saarbruecken, DE;
Viktor Shevaldykin, Moskau, RU;
ACS SOLUTIONS GMBH, Saarbruecken, DE;
Abstract
The invention is a method for the nondestructive examination of a test specimen using ultrasound. Ultrasonic waves are coupled into the test specimen with ultrasonic transducers. Ultrasonic waves, which are reflected within the test specimen, are received by the ultrasonic transducers and converted into ultrasonic signals. The method determines an average noise level, to which all discrete signal information is subjected, determines volume elements assigned to each discrete signal information having a signal level with a signal-to-noise ratio R (which is referred to as an average noise level), of 6 dB≤R, determines pairs of volumes separated by a distance A which is equal to or less than a wavelength of the ultrasonic waves coupled into the test specimen. Volumes are combined into a group and the discrete signal information is evaluated, based on at least one of polarization, frequency, wave type and wave mode.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile