The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Feb. 06, 2018
Applicant:

Sony Corporation, Tokyo, JP;

Inventors:

Nobuhiro Hayashi, Kanagawa, JP;

Yuichi Mizutani, Saitama, JP;

Kiyoshi Osato, Chiba, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/14 (2006.01); G01N 33/493 (2006.01); G02B 21/36 (2006.01); G06T 7/70 (2017.01);
U.S. Cl.
CPC ...
G01N 15/1425 (2013.01); G01N 15/1434 (2013.01); G01N 33/493 (2013.01); G02B 21/367 (2013.01); G06T 7/70 (2017.01); G06T 2207/10056 (2013.01);
Abstract

To provide a technology for increasing the speed of sample imaging using a microscope. The present technology provides a flow channel structure including an imaging flow channel in which a fluid containing imaging targets flows in the same direction as the optical axis of an objective lens. The present technology also provides an imaging member including the flow channel structure. The present technology also provides an imaging method that includes imaging an imaging target in an imaging flow channel in which a fluid containing the imaging target flows in the same direction as the optical axis of an objective lens. The present technology also provides an imaging target analysis device and an imaging target analysis system that include the imaging member.


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