The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jan. 15, 2020
Guangdong University of Technology, Guangzhou, CN;
Shengli Xie, Guangzhou, CN;
Kan Xie, Guangzhou, CN;
Yanzhou Zhou, Guangzhou, CN;
Haochuan Zhang, Guangzhou, CN;
GUANGDONG UNIVERSITY OF TECHNOLOGY, Guangzhou, CN;
Abstract
Provided is a device for measuring a lens three-dimensional profile based on laser wavenumber scanning, including: a semiconductor laser for emitting coherent light; a beam splitter for dividing the coherent light into two parts; an optical wedge; a CCD camera for capturing an interference image; a computer for processing image information; a laser controller for adjusting an operating temperature and an operating current of the semiconductor laser; and a bilateral telecentric lens. The coherent light is reflected by the optical wedge and then reaches the bilateral telecentric lens through the beam splitter, to form a first reflected light path. The coherent light is reflected by the measured lens, and then reaches the bilateral telecentric lens through the beam splitter, to form a second reflected light path. The first reflected light path and the second reflected light path form an interference image after passing through the bilateral telecentric lens.