The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jan. 31, 2018
Gamaya SA, Morges, CH;
Yosef Akhtman, St-Prex, CH;
Christophe Galland, Lausanne, CH;
GAMAYA SA, Morges, CH;
Abstract
A system for computational imaging spectroscopy to provide compact and lightweight design, as well as large field of view of an object to be captured. The system includes imaging components, and computational device. The imaging components includes lens assembly, a fixed or variable-diameter aperture, spectral filter array and imaging sensor. The lens assembly provides wide angle of view, image-side telecentricity, and further may correct for longitudinal chromatic aberrations. The lens assembly may not provide correction of lateral chromatic aberrations. Furthermore, the lens assembly provides image-space telecentricity so as to chief rays are incident perpendicular to image sensor. The lens assembly may produce different chromatic aberrations pattern for each wavelength within the spectral range of interest. The pass-band nanofilter array is configured to filter a plurality of specific bands of light reflected from the imaged object and further produces a plurality of spatio-spectral samples of the imaged object projected onto the photosensitive pixels of imaging sensor. The computational device reconstructs complete spectral cube within the spectral range of interest, and further enables the computation of object reflectance at each pixel of the captured image from the plurality of spatio-spectral samples registered by the imaging sensor.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile