The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Dec. 07, 2018
Applicant:
California Institute of Technology, Pasadena, CA (US);
Inventors:
MohammadSadegh Faraji-Dana, Pasadena, CA (US);
Ehsan Arbabi, Arcadia, CA (US);
Amir Arbabi, Sunderland, CA (US);
Andrei Faraon, La Canada Flintridge, CA (US);
Assignee:
CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/02 (2006.01); G02B 5/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/0259 (2013.01); G01J 3/0208 (2013.01); G01J 3/0224 (2013.01); G02B 5/1814 (2013.01); G02B 5/1847 (2013.01); G02B 5/1861 (2013.01);
Abstract
Compact optical devices such as spectrometers are realized with metasurfaces within a dielectric medium confined by reflective surfaces. The metasurfaces control the phase profiles of the reflected electromagnetic waves within the device. In a compact spectrometer, the metasurfaces within the device separate the electromagnetic waves in different wavelengths. The metasurfaces are designed according to their phase profile by varying the size of the array of scatterers.