The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Jun. 20, 2019
Applicant:
University of Rochester, Rochester, NY (US);
Inventors:
Di Xu, Beijing, CN;
Romita Chaudhuri, Kolkata, IN;
Jannick P. Rolland-Thompson, Seneca Falls, NY (US);
Assignee:
University of Rochester, Rochester, NY (US);
Primary Examiner:
Int. Cl.
CPC ...
G02B 13/22 (2006.01); G01B 9/02 (2006.01); G01B 11/24 (2006.01); G02B 27/09 (2006.01); G02B 26/10 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02056 (2013.01); G01B 9/02091 (2013.01); G01B 11/2441 (2013.01); G02B 13/22 (2013.01); G02B 27/0955 (2013.01); G02B 26/101 (2013.01);
Abstract
Optical coherence tomography metrology systems with two highly telecentric objective lenses wherein one or both telecentric objectives can be arranged in a pseudo-bistatic configuration. One featured telecentric objective has a large scanning field of view relevant for broadband laser scanning applications where low uncertainty measurements are desired. Another featured telecentric objective has a large image space NA relevant as a standalone microscope objective or as a probing objective for optical coordinate measurement machines.