The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

May. 02, 2019
Applicant:

Robert Bosch Gmbh, Stuttgart, DE;

Inventors:

Holger Andreas Banzhaf, Laichingen, DE;

Maxim Dolgov, Renningen, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B60W 30/095 (2012.01); G05D 1/02 (2020.01); G05D 1/10 (2006.01); B25J 9/16 (2006.01); B60W 40/10 (2012.01); B60W 50/00 (2006.01); G05D 1/00 (2006.01);
U.S. Cl.
CPC ...
B60W 30/0953 (2013.01); B25J 9/1676 (2013.01); B60W 40/10 (2013.01); B60W 50/0097 (2013.01); G05D 1/0088 (2013.01); G05D 1/0214 (2013.01); G05D 1/106 (2019.05); B60W 2050/002 (2013.01); G05D 1/0206 (2013.01); G05D 2201/0213 (2013.01);
Abstract

A method for ascertaining an expected contour of a mobile or stationary device for avoiding collisions, using at least one control unit that is internal external to the device includes: obtaining a movement trajectory of the device, which contains probability densities based on state estimation, at least based on expected values and covariances; obtaining a base polyhedron and an approximate contour of the device having a limited number of corners, a confidence interval within which a collision with the static and dynamic surroundings of the device is to be avoided being defined; transforming the base polyhedron to the at least one probability density of the movement trajectory that describes the state estimation; and, for each corner of the transformed base polyhedron, computing a transformed device contour, and ascertaining the expected contour of the device with inclusion of all transformed device contours.


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