The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 17, 2021

Filed:

Jul. 27, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Nadav Hanan Shapira, Haifa, IL;

Amiaz Altman, Tel Aviv, IL;

Yoad Yagil, Haifa, IL;

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 6/03 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0073 (2013.01); A61B 6/032 (2013.01); G06T 11/005 (2013.01); G01N 2223/419 (2013.01); G06T 2207/30004 (2013.01);
Abstract

A method for converting spectral CT datasets into electron density datasets with applications in the fields of medical image formation or radiation treatment planning. The method comprises a preparation method that fits free parameters of a generalized electron density prediction model based on obtained electron density values such as data on tissue substitutes, and a conversion method using the fitted parameter prediction model and spectrally decomposed CT data as first and second inputs, respectively. The method is particularly useful in dual-energy CT and more specifically in dual layer detector CT systems.


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