The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 17, 2021
Filed:
Sep. 13, 2018
Topcon Corporation, Tokyo, JP;
Makoto Saika, Tokyo, JP;
TOPCON CORPORATION, Tokyo, JP;
Abstract
An ophthalmologic apparatus is configured to control an optical scanner so as to perform a scan by measurement light in an intersecting direction which intersects a traveling direction of the measurement light, to specify a scan length based on a detection result of interference light corresponding to the scan, the detection result being acquired by an interference optical system, the scan length being a length of a scan range in the intersecting direction within a characteristic region in an anterior segment of the subject's eye, and to specify a movement amount of the subject's eye based on a reference value of the characteristic region and the scan length.