The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Dec. 20, 2017
Applicant:

Tdk Corporation, Tokyo, JP;

Inventors:

Kazuki Kondo, Tokyo, JP;

Kazunori Oshima, Tokyo, JP;

Akira Gotani, Tokyo, JP;

Narutoshi Fukuzawa, Tokyo, JP;

Assignee:

TDK CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02J 50/60 (2016.01); H02J 50/12 (2016.01); G01V 3/10 (2006.01);
U.S. Cl.
CPC ...
H02J 50/60 (2016.02); G01V 3/10 (2013.01); H02J 50/12 (2016.02);
Abstract

An object of the present invention is to improve the accuracy of detection of the metallic foreign object. A metallic foreign object detector includes a sensor part having at least one antenna coil that receives a magnetic field or current to generate a vibration signal, an integration circuit that acquires the integral value of a waveform of a signal corresponding to the vibration signal, and a determination circuit that determines the presence/absence of a metallic foreign object approaching the antenna coil based on the integral value and a criterion integral value which is the integral value obtained in the absence of the approaching metallic foreign object. The integral value and the criterion integral value are obtained by integrating the waveform having the same wavenumber.


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