The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Mar. 26, 2018
Applicant:

Semiconductor Energy Laboratory Co., Ltd., Kanagawa-ken, JP;

Inventors:

Sachiko Kawakami, Kanagawa, JP;

Nozomi Komatsu, Kanagawa, JP;

Satoshi Seo, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01); H01L 51/00 (2006.01); H01L 51/50 (2006.01); G01N 30/74 (2006.01); H01L 51/56 (2006.01); G01N 30/72 (2006.01); G01N 30/88 (2006.01);
U.S. Cl.
CPC ...
H01L 51/003 (2013.01); G01N 30/7233 (2013.01); G01N 30/74 (2013.01); G01N 30/88 (2013.01); H01L 51/5016 (2013.01); H01L 51/5056 (2013.01); H01L 51/5072 (2013.01); H01L 51/56 (2013.01);
Abstract

A method of analyzing a light-emitting element is provided. The method analyzes an organic semiconductor element including an organic semiconductor layer including one or a plurality of layers between a pair of electrodes. The organic semiconductor element is analyzed with use of a step of separating one of the electrodes of the organic semiconductor element, a step of analyzing a stacked layer and/or a mixed state of the exposed organic semiconductor layer by a first mass analysis method, a step of forming a solution by eluting at least any one or a plurality of organic compounds included in layers in the organic semiconductor layer with a solvent, a step of isolating an organic compound included in the solution by liquid chromatography and analyzing the isolated organic compound by a second mass analysis method, a step of comparing a mass-to-charge ratio detected by the first mass analysis method and a mass-to-charge ratio detected by the second mass analysis method, and a step of measuring the physical properties of the isolated organic compound.


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