The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Mar. 02, 2020
Applicant:

X Display Company Technology Limited, Dublin, IE;

Inventors:

Andrew Tyler Pearson, Durham, NC (US);

Erich Radauscher, Raleigh, NC (US);

Christopher Michael Verreen, Raleigh, NC (US);

Matthew Alexander Meitl, Durham, NC (US);

Christopher Andrew Bower, Raleigh, NC (US);

Ronald S. Cok, Rochester, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 25/075 (2006.01); H01L 33/62 (2010.01); H01L 23/538 (2006.01);
U.S. Cl.
CPC ...
H01L 25/0753 (2013.01); H01L 23/538 (2013.01); H01L 33/62 (2013.01); H01L 2924/12041 (2013.01);
Abstract

A method of micro-transfer printing comprises providing a component source wafer and components disposed in, on, or over the component source wafer. A destination substrate and a stamp for transferring the components from the component source wafer to the destination substrate is provided. The component source wafer has an attribute or structure that varies across the component source wafer that affects the structure, operation, appearance, or performance of the components. A first array of components is transferred from the component source wafer to the destination substrate with a first orientation. A second array of components is transferred from the component source wafer to the destination substrate with a second orientation different from the first orientation. Components can be transferred by micro-transfer printing and different orientations can be a different rotation, overlap, interlacing, or offset.


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