The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Jul. 25, 2019
Samsung Display Co., Ltd., Yongin-si, KR;
Dae Youn Cho, Yongin-si, KR;
Hyunho Kim, Cheonan-si, KR;
Hyojung Kim, Goyang-si, KR;
Young-Joo Noh, Anyang-si, KR;
Jongwoo Park, Seongnam-si, KR;
Ju Hee Lee, Asan-si, KR;
Jinwoo Chae, Anyang-si, KR;
Youngtae Choi, Cheonan-si, KR;
Samsung Display Co., Ltd., Yongin-si, KR;
Abstract
An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.