The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Apr. 25, 2019
Applicant:

Fanuc Corporation, Yamanashi, JP;

Inventors:

Kei Hagihara, Yamanashi, JP;

Yoshito Miyazaki, Yamanashi, JP;

Assignee:

FANUC CORPORATION, Yamanashi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G05B 19/404 (2006.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G05B 19/404 (2013.01); G05B 2219/49206 (2013.01);
Abstract

A machine learning device includes a model data selection unit to select, under a change in ambient temperature of a manufacturing machine, a learned model for additional learning of a thermal displacement compensation amount in each axis included in the manufacturing machine with respect to an operation state of the manufacturing machine, and a learned model storage unit to associate and store a pattern of an ambient temperature change curve indicating a transition of a change in the ambient temperature of the manufacturing machine and the learned model that is learned under the change in the ambient temperature. Based on the ambient temperature change curve stored in the learned model storage unit, the model data selection unit selects a learned model suitable for the additional learning of the thermal displacement compensation amount in each axis included in the manufacturing machine with respect to the operation state of the manufacturing machine.


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