The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Sep. 24, 2019
Nec Laboratories America, Inc., Princeton, NJ (US);
Renqiang Min, Princeton, NJ (US);
Kai Li, Somerville, MA (US);
Bing Bai, Princeton Junction, NJ (US);
Hans Peter Graf, South Amboy, NJ (US);
Abstract
A method is provided for visual inspection. The method includes learning, by a processor, group disentangled visual feature embedding vectors of input images. The input images include defective objects and defect-free objects. The method further includes generating, by the processor using a weight generation network, classification weights from visual features and semantic descriptions. Both the visual features and the semantic descriptions are for predicting defective and defect-free labels. The method also includes calculating, by the processor, a cosine similarity score between the classification weights and the group disentangled visual feature embedding vectors. The method additionally includes episodically training, by the processor, the weight generation network on the input images to update parameters of the weight generation network. The method further includes generating, by the processor using the trained weight generation network, a prediction of a test image as including any of defective objects and defect-free objects.