The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Sep. 11, 2019
Applicant:
Nec Laboratories America, Inc., Princeton, NJ (US);
Inventors:
Yi-Hsuan Tsai, San Jose, CA (US);
Manmohan Chandraker, Santa Clara, CA (US);
Shuyang Dai, Durham, NC (US);
Kihyuk Sohn, Fremont, CA (US);
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06N 3/08 (2006.01); G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01); G06K 9/00221 (2013.01); G06K 9/6215 (2013.01); G06K 9/6259 (2013.01); G06N 3/08 (2013.01); G06K 2209/23 (2013.01);
Abstract
Systems and methods for recognizing fine-grained objects are provided. The system divides unlabeled training data from a target domain into two or more target subdomains using an attribute annotation. The system ranks the target subdomains based on a similarity to the source domain. The system applies multiple domain discriminators between each of the target subdomains and a mixture of the source domain and preceding target domains. The system recognizes, using the multiple domain discriminators for the target domain, fine-grained objects.