The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Nov. 17, 2017
Applicant:
International Business Machines Corporation, Armonk, NY (US);
Inventors:
Kumiko Maeda, Chuo-ku, JP;
Yutaka Oishi, Kawasaki, JP;
Chikafumi Yasumoto, Tokyo, JP;
Jiayun Zhu, Tokyo, JP;
Munetaka Ohtani, Fujisawa, JP;
Yoshinori Tahara, Yamato, JP;
Assignee:
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/18 (2006.01); G16H 10/60 (2018.01); G06Q 50/22 (2018.01); G06F 111/10 (2020.01);
U.S. Cl.
CPC ...
G06F 30/20 (2020.01); G06F 17/18 (2013.01); G16H 10/60 (2018.01); G06F 2111/10 (2020.01); G06Q 50/22 (2013.01);
Abstract
An event transition model for producing test data may be generated from a plurality of event records, each event record including an event time of an instance, wherein the event transition model includes a plurality of states, each state corresponding to one or more instances of the plurality of event records, event transition probabilities between states, and event transition interval times between states.