The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jan. 20, 2021
Applicant:

Sas Institute Inc., Cary, NC (US);

Inventors:

Ryan Adam Lekivetz, Cary, NC (US);

Bradley Allen Jones, Cary, NC (US);

Joseph Albert Morgan, Raleigh, NC (US);

Caleb Bridges King, Cary, NC (US);

Assignee:

SAS Institute Inc., Cary, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 30/12 (2020.01); G06F 17/18 (2006.01); G06F 30/27 (2020.01); G06F 111/20 (2020.01);
U.S. Cl.
CPC ...
G06F 30/12 (2020.01); G06F 17/18 (2013.01); G06F 30/27 (2020.01); G06F 2111/20 (2020.01);
Abstract

A computing system generates a subset of design cases of candidate design cases. The system indexes, in the subset, data elements. The system generates a design of an experiment by, for each respective data element, determining a status indicating whether the respective data element corresponds to an uncontrolled factor or a controlled factor. When the status indicates the uncontrolled factor, the system determines if substituting a respective set of specified options of a respective candidate design case comprising the respective data element with a different set of specified options of the candidate design cases improves a criterion measure according to a design criterion. When the status indicates the controlled factor, the system determines if changing an assigned option of the respective data element improves the criterion measure. The system updates the criterion measure with an updated criterion measure according to a change of the subset based on generating the design.


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