The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Feb. 20, 2020
International Business Machines Corporation, Armonk, NY (US);
Andrew C. M. Hicks, Wappingers Falls, NY (US);
Ryan Thomas Rawlins, New Paltz, NY (US);
Dale E. Blue, Poughkeepsie, NY (US);
Brian Mo, Rego Park, NY (US);
INTERNATIONAL BUSINESS MACHINES CORPORATION, Armonk, NY (US);
Abstract
A method for detecting and localizing a fault in a system under test (SUT) includes generating an initial set of test cases using combinatorics test design. The method further includes determining, based at least in part on a first set of execution results, a set of failing test cases. The method further includes determining, based on a machine learning model, a subset of false positives from the failing test cases. The method further includes generating a set of new test cases from a selected failing test case that is not in the subset of false positives. The method further includes executing the set of new test cases to obtain a second set of execution results, and localizing the fault based at least in part on the second set of execution results.