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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11086755 B1

PDFFull Text
Expired
Date of Patent:
Aug. 10, 2021

Filed:

Jun. 26, 2018

System and method for implementing an application monitoring tool

Applicant:

Jpmorgan Chase Bank, N.a., New York, NY (US);

Inventors:

Daniel J. Gaier, Powell, OH (US);

Brian R. Pennell, Galena, OH (US);

David Richard Kalkstein Deloveh, Columbus, OH (US);

Tristan Chiappisi, Gahanna, OH (US);

Paul Knuth, Westerville, OH (US);

Michael Frank, Chicago, IL (US);

Assignee:

JPMORGAN CHASE BANK, N.A., New York, NY (US);

Attorney:

Hunton Andrews Kurth LLP

Primary Examiner:

Chameli Das

Int. Cl.
CPC ...
G06F 9/44 (2018.01); G06F 11/36 (2006.01); G06F 11/34 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3612 (2013.01); G06F 11/302 (2013.01); G06F 11/3055 (2013.01); G06F 11/3082 (2013.01); G06F 11/3419 (2013.01); G06F 11/3452 (2013.01); G06F 11/3616 (2013.01); G06F 11/3664 (2013.01); G06F 2201/835 (2013.01); G06F 2201/865 (2013.01); G06F 2201/88 (2013.01);
Abstract

The invention relates to an application monitoring tool. According to an embodiment of the present invention, the application monitoring tool has an integrated event/tracing API that traces distributed and non-distributed system flows. For example, a tracing approach may be integrated with a Metrics functionality in that tracing may be throttled or turned on/off based on defined intervals, threshold breaches, and/or anomaly detection of related metrics. If an application's web service calls are beginning to take longer than 'normal,' an event/tracing collection feature may be activated to trace calls to enable deeper analysis of the problem.

Find Patent Forward Citations

Gaier, Daniel. (2021). System and method for implementing an application monitoring tool (U.S. Patent No. 11086755). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11086755

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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