The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Aug. 06, 2019
Applicant:
SK Hynix Inc., Gyeonggi-do, KR;
Inventors:
Assignee:
SK hynix Inc., Gyeonggi-do, KR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G08C 25/00 (2006.01); H03M 13/00 (2006.01); H04L 1/00 (2006.01); G06F 11/14 (2006.01); G06F 11/10 (2006.01); G11C 16/26 (2006.01); G11B 20/10 (2006.01); G11C 16/34 (2006.01); G11B 20/18 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1402 (2013.01); G06F 11/102 (2013.01); G06F 11/1048 (2013.01); G06F 11/141 (2013.01); G11B 20/10388 (2013.01); G11C 16/26 (2013.01); G11C 16/3431 (2013.01); G11B 2020/183 (2013.01);
Abstract
A memory system may include: a memory device including a plurality of storage regions; and a controller. The controller may be coupled between a host and the memory device, and perform a read retry operation when a read error occurs in any one of the storage regions based on occurrence possibilities for a plurality of different type of defects in any one storage region where a read error occurred.