The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Oct. 21, 2019
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Dat Tran, San Jose, CA (US);

Loc Tu, San Jose, CA (US);

Kirubakaran Periyannan, Santa Clara, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 3/0631 (2013.01); G06F 3/0679 (2013.01);
Abstract

Consecutive logical block addresses (LBAs) are mapped to consecutive good blocks in a sequence of blocks in a memory device. For each bad block, a mapping process substitutes a next available good block. For a selected LBA, the mapping process determines a number X>1 of bad blocks before, and including, a corresponding block in the sequence, a number Y of bad blocks in the X blocks after the corresponding block in the sequence, and maps the LBA to a block which is X+Y blocks after the corresponding block, or, if the block which is X+Y blocks after the corresponding block is a bad block, to a next good block. The mapping technique can be used for a sequence of blocks in a trimmed die, where a bad block register stores physical block addresses of the trimmed away blocks.


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