The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jan. 15, 2020
Applicant:

Splunk Inc., San Francisco, CA (US);

Inventors:

Erick Anthony Dean, Piedmont, CA (US);

Jindrich Dinga, Los Altos, CA (US);

Marvin Herville Green, Benicia, CA (US);

Assignee:

Splunk Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/4063 (2006.01); G06F 16/26 (2019.01); G06F 16/901 (2019.01); G06F 16/9535 (2019.01);
U.S. Cl.
CPC ...
G05B 19/4063 (2013.01); G06F 16/26 (2019.01); G06F 16/9017 (2019.01); G06F 16/9027 (2019.01); G06F 16/9535 (2019.01); G05B 2219/32404 (2013.01);
Abstract

An example method of implementing a control interface for metric definition specification for asset-driven hierarchy includes: causing display of a user interface for configuring a metric definition for a metric of an asset node of the asset hierarchy; receiving, via the user interface, a metric determination specification comprising an identification of a metric component, an identification of an operation to apply to the metric component, and metric time factors corresponding to time-related aspects of the metric definition; and reflecting, in a computer storage, the metric definition comprising an association of the metric determination specification with the metric.


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