The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jul. 27, 2018
Applicant:

Unm Rainforest Innovations, Albuquerque, NM (US);

Inventors:

Steven R.J. Brueck, Albuquerque, NM (US);

Alexander K. Raub, Danbury, CT (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 6/13 (2006.01); G03F 7/00 (2006.01); G03F 7/40 (2006.01); G03F 7/32 (2006.01); B82Y 20/00 (2011.01);
U.S. Cl.
CPC ...
G03F 7/0005 (2013.01); B82Y 20/00 (2013.01); G03F 7/2022 (2013.01); G03F 7/2041 (2013.01); G03F 7/32 (2013.01); G03F 7/40 (2013.01); G02F 2202/32 (2013.01);
Abstract

In accordance with some aspects of the present disclosure, a maskless interferometric lithography system for fabricating a three-dimensional (3D) photonic crystal using a multiple two-beam-exposures is disclosed. The system can comprise an illumination system comprising an optical arrangement operable to receive radiation from a radiation source and provide three or more tilted two-beam interference pattern exposures to be combined into a three-dimensional pattern; and a substrate operable to be supported by a substrate table, wherein the substrate comprises a photoresist formed on a top surface of the substrate and operable to receive the three-dimensional pattern and wherein means are provided to adjust the position of the substrate in all six mechanical degrees of freedom.


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