The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 10, 2021

Filed:

Jan. 22, 2019
Applicant:

Saudi Arabian Oil Company, Dhahran, SA;

Inventors:

Yang Zhao, Katy, TX (US);

Houzhu Zhang, Houston, TX (US);

Hongwei Liu, Dhahran, SA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/30 (2006.01); G01V 1/36 (2006.01);
U.S. Cl.
CPC ...
G01V 1/307 (2013.01); G01V 1/362 (2013.01); G01V 2210/512 (2013.01); G01V 2210/632 (2013.01);
Abstract

In a general implementation, systems, apparatus, and methods for AVO of imaging condition in ERTM include the described system provides for an efficient and accurate vector wavefield decomposition with a corresponding modified dot-product imaging condition of ERTM by employing a modified AVO algorithm. In some implementations, the phases of source wavelet and multicomponent records are modified using a 1/ω2 filter and the amplitudes of the extrapolated wavefields are scaled using α2 and β2, where ω, α and β are the angular frequency, local P- and S-wave velocities, respectively. The results yield correct phases, amplitudes, and physical units for separated P- and S-mode wavefields. Divergence and curl operators may then be applied to the phase-corrected and amplitude-scaled elastic wavefields to extract vector P- and S-wavefields. With the separated vector wavefields, a modified dot-product imaging condition can be employed to produce PP and PS reflectivity images.


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