The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 10, 2021
Filed:
Mar. 25, 2016
Applicant:
Microwave Characterization Center, Sainghin-en-Melantois, FR;
Inventors:
Florent Clemence, Villeneuve d'Ascq, FR;
Nicolas Thouvenin, Faches-Thumesnil, FR;
Matthieu Werquin, Lesquin, FR;
Sylvain Jonniau, Croix, FR;
Nicolas Vellas, Richebourg, FR;
Assignee:
Microwave Characterization Center, Sainghin-en-Melantois, FR;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/88 (2006.01); H01Q 3/20 (2006.01); H01Q 19/06 (2006.01); G01S 13/89 (2006.01); G01S 7/40 (2006.01); G01S 13/42 (2006.01); G01S 7/03 (2006.01); G01V 8/00 (2006.01); H01Q 3/14 (2006.01); H01Q 3/16 (2006.01);
U.S. Cl.
CPC ...
G01S 13/887 (2013.01); G01S 7/032 (2013.01); G01S 7/4021 (2013.01); G01S 13/426 (2013.01); G01S 13/89 (2013.01); G01V 8/005 (2013.01); H01Q 3/14 (2013.01); H01Q 3/16 (2013.01); H01Q 3/20 (2013.01); H01Q 19/062 (2013.01);
Abstract
The present invention relates to an imaging device () comprising: In particular, the reflector means () are mounted to move in the detection zone of each microwave sensor () in such a manner as to move said detection zone by moving the reflector means (). The invention also provides a corresponding microwave imaging method.